Intermittent Operating Life (IOL)

IOL Test Chamber

Intermittent Operating Life Testing

Our Intermittent Operating Life (IOL) Test System is designed to evaluate semiconductor and electronic devices under repeated power-on, power-off and thermal cycling conditions.

IOL testing helps identify potential failures caused by repeated electrical and thermal stress, making it suitable for power semiconductors, automotive electronics, LEDs, ICs, modules and other reliability-critical devices.

 

Key Features

• Programmable power ON/OFF cycling
• Controlled high-temperature testing environment
• Fast and repeatable thermal cycling
• Customized DUT fixtures and test boards
• Temperature and electrical parameter monitoring
• Data logging and test report generation
• Optional power supply and automated test integration
• Safety protection for long-duration unattended testing

 

Typical Applications

• Power semiconductor reliability testing
• MOSFET, IGBT and diode testing
• Automotive electronic components
• LED and lighting devices
• IC and module reliability testing
• SiC and GaN device evaluation

 

Typical Specifications

Parameter	Specification
Temperature Range	Up to +200°C, depending on configuration
Operating Cycle	Programmable ON / OFF
DUT Capacity	Customized
Test Fixtures	Customized
Temperature Monitoring	Available
Data Logging	Available
Power Supply Integration	Optional
Test Automation	Optional

We configure the IOL system with the chamber, DUT fixtures, power supplies, monitoring and automation to meet your specific reliability test requirements.